Calculation of DEP and EWOD forces for application in digital microfluidics

Journal of Fluids Engineering, Transactions of the ASME

Volumn 130, Issue 8, 2008, Pages 0816031-0816039

  Young, Patrick M ^a   Mohseni, Kamran ^a  

^a UCB 450   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTING FLUIDS; CONTACT ANGLES; DEP FORCES; DIELECTROPHORESIS; DIGITAL MICROFLUIDICS; ELECTRICALLY INSULATING; ELECTRODE LENGTHS; ELECTRODE SPACINGS; ELECTROSTATIC PRESSURE; ELECTROWETTING-ON-DIELECTRIC; FORCE DENSITIES; FORCE DISTRIBUTIONS; IN CHANNELS; LIQUID SLUGGING; LUMPED PARAMETER MODEL; MICRO-DROPLETS; SCALING PROPERTIES; SYSTEM PARAMETERS; TRANSVERSE-ELECTRIC FIELDS;

CONTACT ANGLE; DIGITAL ARITHMETIC; DROP FORMATION; DROPS; ELECTRIC FIELDS; ELECTROLYSIS; ELECTROMAGNETIC FIELD THEORY; ELECTROMAGNETIC FIELDS; ELECTROPHORESIS; FLUID MECHANICS; METALLIZING;

DIELECTRIC DEVICES;

EID: 52049115422     PISSN: 00982202     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.2956606     Document Type: Conference Paper

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42. If the droplet is initially charged or if it is short cut to the electrodes on one side of the channel while isolated from the electrodes on die other side, there will be another source of force on the droplet represented locally by pfE. Our approach here can be easily extended to this case as well.
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