메뉴 건너뛰기




Volumn 10, Issue , 2008, Pages

Single-molecule electron diffraction imaging with charge replacement

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; ELECTRON DIFFRACTION;

EID: 52049102867     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/10/9/093015     Document Type: Article
Times cited : (6)

References (26)
  • 5
    • 52049123364 scopus 로고    scopus 로고
    • Howells M R et al 2005 arXiv:physics/0502059
    • Howells M R et al 2005 arXiv:physics/0502059
  • 21
    • 52049112622 scopus 로고    scopus 로고
    • Jablonski A, Salvat F and Powell C J 2002 NIST Electron Elastic-Scattering Cross-Section Database- Version 3.0. (Gaithersburg, MD: National Institute of Standards and Technology)
    • Jablonski A, Salvat F and Powell C J 2002 NIST Electron Elastic-Scattering Cross-Section Database- Version 3.0. (Gaithersburg, MD: National Institute of Standards and Technology)
  • 22
    • 0043023820 scopus 로고
    • Scanning Electron Microscopy
    • ed P W Hawkes Berlin: Springer
    • Reimer L 1985 Scanning Electron Microscopy (Springer Series in Optical Sciences) ed P W Hawkes (Berlin: Springer)
    • (1985) Springer Series in Optical Sciences
    • Reimer, L.1
  • 23
    • 52049087891 scopus 로고    scopus 로고
    • http://physics.nist.gov/PhysRefDat/Ionization/molTable.html


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.