Comparison of combination methods utilizing T-normalization and second best score model

2008 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops

Volumn , Issue , 2008, Pages

  Tulyakov, Sergey ^a   Zhang, Zhi ^a   Govindaraju, Venu ^a  

^a UNIVERSITY AT BUFFALO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARTIFICIAL INTELLIGENCE; BIOMETRICS; COMPUTER VISION; FEATURE EXTRACTION; IMAGE PROCESSING; MAXIMUM LIKELIHOOD ESTIMATION; PATTERN RECOGNITION;

BIOMETRIC MATCHING; COMBINATION METHODS; IDENTIFICATION MODELS; LIKELIHOOD RATIO; MULTI-LAYER PERCEPTRON; PERFORMANCE IMPROVEMENTS;

NEURAL NETWORKS;

EID: 52049090335     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPRW.2008.4563105     Document Type: Conference Paper

References (17)

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