A layered approach to semantic similarity analysis of XML schemas

2008 IEEE International Conference on Information Reuse and Integration, IEEE IRI-2008

Volumn , Issue , 2008, Pages 274-279

  Kim, Jaewook ^a,b   Peng, Yun ^a   Kulvatunyou, Serm ^b   Ivezic, Nenad ^b   Jones, Albert ^b  

^a Baltimore County

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

E business integration; Information content; Schema mapping; Similarity measure; XML schema

Indexed keywords

CRITICAL STEPS; E-BUSINESS APPLICATIONS; E-BUSINESS INTEGRATION; ERROR-PRONE; INFORMATION CONTENT; INFORMATION CONTENTS; INFORMATION RE-USE; INTERNATIONAL CONFERENCES; REAL-WORLD APPLICATIONS; SCHEMA MAPPING; SCHEMA MAPPINGS; SCHEMAS; SEMANTIC INFORMATION; SEMANTIC SIMILARITY; SEMANTIC STRUCTURES; SIMILARITY MEASURE; SIMILARITY MEASURES; XML SCHEMA; XML-SCHEMAS;

CONFORMAL MAPPING; ELECTRONIC COMMERCE; INFORMATION THEORY; INFORMATION USE; INTEGRATION; MARKUP LANGUAGES; SEMANTICS; TECHNOLOGY; XML;

INFORMATION MANAGEMENT;

EID: 51949100240     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRI.2008.4583042     Document Type: Conference Paper

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