Ultrasonic time-of-flight diffraction crack size identification based on cross-correlation

Canadian Conference on Electrical and Computer Engineering

Volumn , Issue , 2008, Pages 1797-1800

  Zhang, Yonghong ^a   Wang, Yu ^a   Zuo, Ming J ^a   Wang, Xiaodong ^a  

^a UNIVERSITY OF ALBERTA   (Canada)

Author keywords

Cross correlation; Pulse echo; Size identification; TOFD

Indexed keywords

DIFFRACTION; NEGATIVE IONS; TECHNOLOGY; ULTRASONIC APPLICATIONS; ULTRASONIC TESTING; ULTRASONICS;

CRACK SIZES; CROSS CORRELATIONS; CROSS-CORRELATION; CROSS-CORRELATION FUNCTION; DEFECT SIZES; DEFECT SIZING; ELECTRICAL AND COMPUTER ENGINEERING; PULSE ECHO; SIZE IDENTIFICATION; TIME -OF-FLIGHT; TIME-OF-FLIGHT DIFFRACTION; TOFD; ULTRASONIC DETECTION; ULTRASONIC TIME-OF-FLIGHT DIFFRACTION;

CORRELATION METHODS;

EID: 51849159717     PISSN: 08407789     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CCECE.2008.4564854     Document Type: Conference Paper

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