Shear-wave time of flight diffraction (S-TOFD) technique

NDT and E International

Volumn 39, Issue 6, 2006, Pages 458-467

  Baskaran, G ^a   Balasubramaniam, Krishnan ^a   Lakshmana Rao, C ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

Author keywords

ESIT; STOFD; TOFD; Ultrasonic

Indexed keywords

DEFECTS; ECHO SUPPRESSION; PLATES (STRUCTURAL COMPONENTS); SIGNAL PROCESSING; SURFACE PROPERTIES;

ESIT; STOFD; TOFD;

SHEAR WAVES;

EID: 33745684593     PISSN: 09638695     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ndteint.2006.01.003     Document Type: Article

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