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Volumn , Issue , 2007, Pages

T-Diodes - A novel plug-and-play wideband RF circuit ESD protection methodology

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROSTATIC DEVICES; ELECTROSTATIC DISCHARGE; LOW NOISE AMPLIFIERS;

EID: 51849157791     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EOSESD.2007.4401759     Document Type: Conference Paper
Times cited : (13)

References (15)
  • 1
    • 51849094268 scopus 로고    scopus 로고
    • R. Bagheri, et al., IEEE ISSC, pp. 1932-1941, p. 26.6, 2006.
    • R. Bagheri, et al., IEEE ISSC, pp. 1932-1941, p. 26.6, 2006.
  • 6
    • 51849109751 scopus 로고    scopus 로고
    • K. Bhatia, et al., Proc. IEEE CICC, pp. 385-388, 2006.
    • (2006) Proc. IEEE , vol.299 , pp. 385-388
    • Bhatia, K.1
  • 8
    • 34247391533 scopus 로고    scopus 로고
    • K. Bhatia, et al., IEEE J. of Solid-State Circuits, A Compact, ESD-Protected, SiGe BiCMOS LNA for Ultra-Wideband Applications, 42, no. 5, May 2007, pp. 1121-1130.
    • K. Bhatia, et al., IEEE J. of Solid-State Circuits, "A Compact, ESD-Protected, SiGe BiCMOS LNA for Ultra-Wideband Applications", vol. 42, no. 5, May 2007, pp. 1121-1130.
  • 9
    • 51849166751 scopus 로고    scopus 로고
    • W. Soldner, et al, Proc. IEEE ISSCC A 10GHz Broadband Amplifier with Bootstrapped 2kV ESD Protection, pp. 21-22, 2007.
    • W. Soldner, et al, Proc. IEEE ISSCC "A 10GHz Broadband Amplifier with Bootstrapped 2kV ESD Protection", pp. 21-22, 2007.
  • 12
    • 0042092328 scopus 로고    scopus 로고
    • T.S. Horng, et al, Proc MTT 2003, A novel Modified -T Equivalent Circuit for Modeling LTCC Embedded Inductors with a Large Bandwidth , pp. 1015-1018, 2003
    • T.S. Horng, et al, Proc MTT 2003, "A novel Modified -T Equivalent Circuit for Modeling LTCC Embedded Inductors with a Large Bandwidth" , pp. 1015-1018, 2003
  • 13
    • 51849084131 scopus 로고    scopus 로고
    • rfic.eecs.berkeley.edu/~niknejad/asitic.html
  • 14
    • 33847157952 scopus 로고    scopus 로고
    • Advanced SCR ESD protection circuits for CMOS/SOI nanotechnologies
    • pp
    • M.P.J. Mergens, et al, Proc IEEE CICC, "Advanced SCR ESD protection circuits for CMOS/SOI nanotechnologies", pp. 481 - 488, 2005.
    • (2005) Proc IEEE CICC , pp. 481-488
    • Mergens, M.P.J.1
  • 15
    • 51849131524 scopus 로고    scopus 로고
    • Calibrated wafer-level HBM measurements for quasi-static and transient device analysis
    • M. Scholz, et al, "Calibrated wafer-level HBM measurements for quasi-static and transient device analysis", to be presented at EOS/ESD symposium 2007.
    • (2007) to be presented at EOS/ESD symposium
    • Scholz, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.