Nanostructural characterization of TiNiSn-based half-Heusler compounds

International Conference on Thermoelectrics, ICT, Proceedings

Volumn , Issue , 2007, Pages 263-266

  Matsubara, M ^a   Asahi, R ^a   Nakagaki, T ^a   Isheim, D ^b   Seidman, D N ^b  

^a Rd Management Section   (Japan)

^b NORTHWESTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARSENIC COMPOUNDS; ELECTRIC POWER FACTOR; SILICON;

COMPOSITIONAL HOMOGENEITY; HALF-HEUSLER; HALF-HEUSLER COMPOUNDS; INTERNATIONAL CONFERENCES; MATERIALS PROCESSING; POWER FACTOR; RADIO FREQUENCIES; THERMOELECTRICS;

CHLORINE COMPOUNDS;

EID: 51849134574     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICT.2007.4569475     Document Type: Conference Paper

References (11)

1. Katayama, T. et al. "The Effect of Quaternary Additions on Thermoelectric Properties of TiNiSn-Based Half-Heusler Alloys," J. Electronic Mater., Vol. 32, (2003), pp. 1160-1165.
2. 1-xNiSn Half-Heusler Compounds," J. Alloys and Comp. Vol 389, (2005), pp. 204-208.
3. Katsuyma, S. et al., "Effect of Substitution for Ni by Co and/or Cu on the Thermoelectric Properties of Half-Heusler ZrNiSn," J. Alloys and Comp., Vol. 385, (2004), pp. 232-237.
4. Kurasaki, S. et al., "Effect of Spark Plasma Sintering Temperature on Thermoelectric Properties of (Ti,Zr,Hf)NiSn Half-Heusler Compounds," J. Alloys and Comp., Vol. 397, (2005), pp. 296-299.
5. Hazama, H. et al., "Materials Design and Synthesis of the High Performance TiNiSn-based Thermoelectric Compounds," Proc. Annual Meeting of TSJ, 2006, pp. 16-17.
6. Seidman, D.N., "Three-Dimensional Atom-Probe Tomography: Advances and Applications," Annual Review of Materials Research, Vol. 37, (2007), pp. 127-158.
7. Larson, D.J. et al., "Atom Probe Characterization of Nanomagnetic Materials," Thin Solid Films, Vol. 505, (2006), pp. 16-21.
8. Krakauer, B.W., et al. "A System for Systematically Preparing Atom-Probe Field-Ion Microscope Specimens for the Study of Internal Interfaces," Review of Scientific Instruments Vol. 61, (1990), pp. 3390-3398.
9. Krakauer, B.W. and Seidman, D.N., "Systematic Procedures for Atom-Probe Field-Ion Microscopy Studies of Grain Boundary Segregation," Review of Scientific Instruments Vol. 63, (1992), pp.4071-4079.
10. 2+m: Bulk Thermoelectric Materials with High Figure of Merit," Science, Vol. 303, (2004), pp. 818-820.
11. 2+m (m=6,14,30)," Phys. Rev. B, Vol. 73, (2006), pp. 115108-1-7.