Nano-optical microlens with ultrashort focal length using negative refraction

Applied Physics Letters

Volumn 93, Issue 5, 2008, Pages

  Casse, B D F ^a   Lu, W T ^a   Huang, Y J ^a   Sridhar, S ^a  

^a NORTHEASTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTERIZED TOMOGRAPHY; ELECTRIC CONDUCTIVITY; FOCUSING; LIGHT REFRACTION; PHOTONIC CRYSTALS; REFRACTION; REFRACTIVE INDEX; SEMICONDUCTOR MATERIALS;

DIFFRACTION LIMITEDS; FINITE-DIFFERENCE TIME-DOMAIN SIMULATIONS; FOCAL LENGTHS; FOCUSED BEAMS; FOCUSING PROPERTIES; FULL WIDTH AT HALF-MAXIMUM; HETEROSTRUCTURE; INP/INGAASP; MICRO LENS; NEGATIVE INDEX OF REFRACTIONS; NEGATIVE INDICES; NEGATIVE REFRACTIONS; NEGATIVE REFRACTIVE INDICES; NUMERICAL APERTURES; OPTO-ELECTRONIC APPLICATIONS; SPOT SIZES; TWO-DIMENSIONAL (2D) PHOTONIC CRYSTAL;

MICROLENSES;

EID: 51849128692     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2968873     Document Type: Article

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