How does inversed temperature dependence affect timing sign-off

Proceedings - 2008 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT

Volumn , Issue , 2008, Pages 297-300

  Wu, Sean H ^a,b   Tetelbaum, Alexander ^a   Wang, Li C ^b  

^a AGERE SYSTEMS   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT DESIGN; INTERNATIONAL CONFERENCES; ON CHIPS; PROCESSING TECHNOLOGIES; SIGN-OFF; STANDARD-CELL LIBRARIES; SUPPLY VOLTAGES; SWITCHING TIME; TEMPERATURE DEPENDENCES; TYPICAL DESIGN;

ELECTRIC BATTERIES; ELECTRONICS INDUSTRY; INTEGRATED CIRCUIT MANUFACTURE; INTEGRATED CIRCUITS; NETWORKS (CIRCUITS); STANDARDS; TECHNOLOGY; TEMPERATURE DISTRIBUTION;

TIME MEASUREMENT;

EID: 51849107322     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICICDT.2008.4567300     Document Type: Conference Paper

References (5)

1. R. Kumar, V. Kursun, '"Reversed Temperature-Dependent Propagation Delay Characteristics in Nanometer CMOS Circuits'" IEEE Trans. on Circuit and Systems, Vol 53, NO 10. OCT 2006
2. V. Gerousis, '"Design and Modeling Challenges for 90nm and 50nm"' Custom integrated Circuits Conf., 2003
3. B. Lasbouygues et al., '"Temperature- and Voltage-Aware Timing Analysis'" IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems. Vol. 26, No 4, Apr 2007
4. C Park et al., '"Reveral of Temperature Dependence of Integrated Circuits Operating at Very Low Voltages"' "'IEDM Conf., 1995
5. A. Dasdan, I. Horn, '"Handling Inverted Temperature Dependence in Static timing Analysis'" "'ACM Trac. on Design Automation of Electronic Systems, Vol. 11, No. 2, Apr. 2006