Physical framework for NBTI: Insight from ultra-fast switching measurement of NBTI recovery

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2008, Pages 735-736

  Du, G A ^a,b   Ang, D S ^a   Hu, Y Z ^a   Wang, S ^a   Ng, C M ^b  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b CHARTERED SEMICONDUCTOR MANUFACTURING LTD   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

MEASUREMENT METHODS; RELIABILITY PHYSICS; ULTRA-FAST;

RELIABILITY;

EID: 51649093838     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2008.4559013     Document Type: Conference Paper

References (6)

1. Reisinger et al., IRPS 2006, pp. 448453;
2. Shen et al., IEDM 2006, pp. 1-4;
3. Parthasarathy et al., IRPS 2006, pp. 471-477;
4. Grasser et al., IRPS 2007, pp. 268-280;
5. Ang and Wang, IEEE EDL, 27, pp. 914-916, 2006;
6. Godet et al., Phys. Rev. Lett., 99, art. no. 126102, 2007.