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Volumn , Issue , 2008, Pages 132-137
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Managing multi-core soft-error reliability through utility-driven cross domain optimization
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Author keywords
[No Author keywords available]
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Indexed keywords
CROSS-DOMAIN;
MULTI CORES;
ARSENIC COMPOUNDS;
CHIP SCALE PACKAGES;
COMPUTER NETWORKS;
ELECTRONIC EQUIPMENT MANUFACTURE;
ERROR ANALYSIS;
ERROR CORRECTION;
INFORMATION MANAGEMENT;
MANAGEMENT;
NANOTECHNOLOGY;
OPTIMIZATION;
RESOURCE ALLOCATION;
TRANSISTORS;
MICROPROCESSOR CHIPS;
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EID: 51649088958
PISSN: 10636862
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ASAP.2008.4580167 Document Type: Conference Paper |
Times cited : (15)
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References (11)
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