Study of strain and wetting phenomena in porous silicon by Raman scattering

Journal of Raman Spectroscopy

Volumn 39, Issue 2, 2008, Pages 199-204

  Ferrara, M A ^a,b   Donato, M G ^b   Sirleto, L ^a   Messina, G ^b   Santangelo, S ^b   Rendina, I ^a  

^a CNR IMM   (Italy)

^b UNIVERSITY MEDITERRANEA OF REGGIO CALABRIA   (Italy)

Author keywords

Raman effect; Raman scattering; Raman spectroscopy; Scattering measurements

Indexed keywords

LATTICE MISMATCH; POROUS SILICON; RAMAN SPECTROSCOPY; WETTING;

BLUE SHIFT; BULK SILICON; POROUS SILICON LAYERS; SCATTERING MEASUREMENTS; SILICON SUBSTRATES; WETTING CONDITIONS; WETTING PHENOMENON;

RAMAN SCATTERING;

EID: 51549107519     PISSN: 03770486     EISSN: 10974555     Source Type: Journal    
DOI: 10.1002/jrs.1846     Document Type: Article

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