An improved methodology for monitoring NBTI induced threshold voltage shift of scaled

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2008, Pages 743-744

  Hu, Y Z ^a   Ang, D S ^a   Du, G A ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

NEGATIVE TEMPERATURE COEFFICIENT; RELIABILITY; THRESHOLD VOLTAGE;

LINEAR DRAIN CURRENT; MEASUREMENT METHODS; NBTI CHARACTERIZATION; RELIABILITY PHYSICS;

THERMODYNAMIC STABILITY;

EID: 51549099622     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2008.4559017     Document Type: Conference Paper

References (7)

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3. Varghese et al., IEDM 2005. pp. 684-687;
4. Reisinger et al., IRPS 2006, pp. 448-453;
5. Shen et al., IEDM'2006, pp. 1-4;
6. Oritz-Conde et al., Microelectron. Reliab., 42, pp. 583-596, 2002;
7. Ang and Wang, APL, 88, art. no. 093506, 2006.