메뉴 건너뛰기




Volumn , Issue , 2007, Pages 610-613

Optimizing MOSFET channel width for low phase noise in LC oscillators

Author keywords

[No Author keywords available]

Indexed keywords

MOSFET DEVICES; NETWORKS (CIRCUITS); SPURIOUS SIGNAL NOISE;

EID: 51449117223     PISSN: 15483746     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSCAS.2007.4488655     Document Type: Conference Paper
Times cited : (2)

References (9)
  • 1
    • 0023315445 scopus 로고
    • Phase Noise Reduction in FET Oscillators by Low-Frequency Loading and Feedback Circuitry Optimization
    • Mar Pages
    • Prigent, M.; Obregon, J, "Phase Noise Reduction in FET Oscillators by Low-Frequency Loading and Feedback Circuitry Optimization", Microwave Theory and techniques, IEEE Transactions on, Volume 35, Issue 3, Mar 1987 Page(s):349 - 352
    • (1987) Microwave Theory and techniques, IEEE Transactions on , vol.35 , Issue.3 , pp. 349-352
    • Prigent, M.1    Obregon, J.2
  • 2
    • 10744230455 scopus 로고    scopus 로고
    • Optimization of an ultra low-phase noise sapphire-SiGe HBT oscillator using nonlinear CAD, Ultrasonics, Ferroelectrics and Frequency Control
    • Jan Pages
    • Cibiel, G.; Regis, M.; Llopis, O.; Rennane, A.; Bary, L.; Plana, R.; Kersale, Y.; Giordano, V. "Optimization of an ultra low-phase noise sapphire-SiGe HBT oscillator using nonlinear CAD", Ultrasonics, Ferroelectrics and Frequency Control, IEEE Transactions on, Volume 51, Issue 1, Jan 2004 Page(s): 33 - 41
    • (2004) IEEE Transactions on , vol.51 , Issue.1 , pp. 33-41
    • Cibiel, G.1    Regis, M.2    Llopis, O.3    Rennane, A.4    Bary, L.5    Plana, R.6    Kersale, Y.7    Giordano, V.8
  • 4
    • 0034860732 scopus 로고    scopus 로고
    • Aoki H., Masanori S., Channel Width and Length Dependent Flicker Noise Characterization for n-MOSFETs, Proc. IEEE 2001 Int. Conference on Microelectronic Test Structures, 14, March 2001
    • Aoki H., Masanori S., "Channel Width and Length Dependent Flicker Noise Characterization for n-MOSFETs", Proc. IEEE 2001 Int. Conference on Microelectronic Test Structures, Vol 14, March 2001
  • 5
  • 7
    • 51449122061 scopus 로고    scopus 로고
    • PhD dissertation, The Ohio State University, Department of Electrical and Computer Engineering
    • Mukherjee J, PhD dissertation, The Ohio State University, Department of Electrical and Computer Engineering, http://www.ohiolink.edu/etd/view.cgi? acc%5Fnum=osu1149061925
    • Mukherjee, J.1
  • 8
    • 33645958891 scopus 로고    scopus 로고
    • Novel Modeling Methodology of LC Differential Oscillator Phase Noise
    • John Wiley, April
    • Mukherjee J., Roblin P., "Novel Modeling Methodology of LC Differential Oscillator Phase Noise", Microwave and Opt Tech Letters, John Wiley, April 2006.
    • (2006) Microwave and Opt Tech Letters
    • Mukherjee, J.1    Roblin, P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.