Development of a material phase detection system using capacitance tomography

IEEE AFRICON Conference

Volumn 2, Issue , 1999, Pages 927-928

  Smit, Q ^a   Tapson, J ^a   Mortimer, B J P ^a  

^a CAPE PENINSULA UNIVERSITY OF TECHNOLOGY   (South Africa)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; COMPUTERIZED TOMOGRAPHY; ELECTRIC CONDUCTANCE; ELECTRIC VARIABLES MEASUREMENT; ELECTRODES; FEEDBACK; IMAGING SYSTEMS; PERMITTIVITY; PHASE SHIFT; PIPELINES; SELF TUNING CONTROL SYSTEMS;

CAPACITANCE TOMOGRAPHY; ELECTRODE CAPACITANCE SENSOR; MASS TRANSFER SYSTEM; MATERIAL PHASE DETECTION SYSTEM; MULTIPLE FEEDBACK LOOPS; MULTIPLEXING CIRCUITS; SELF TUNING CAPACITANCE SENSOR SYSTEM; SELF TUNING CONDUCTANCE SENSOR SYSTEM;

IMAGE SENSORS;

EID: 0033319943     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)