Comparative surface studies on fine-grain and single crystal niobium using XPS, AES, EBSD and profilometry

Proceedings of the IEEE Particle Accelerator Conference

Volumn , Issue , 2007, Pages 2349-2351

  Romanenko, A ^a   Padamsee, H ^a   Eremeev, G ^a   Shu, J ^a  

^a Department of Obstetrics Gynecology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARSENIC COMPOUNDS; CHEMICAL FINISHING; CHEMICAL POLISHING; CHEMICAL PROPERTIES; ELECTRIC IMPEDANCE; ELECTROLYTIC POLISHING; ELECTRON DIFFRACTION; MAGNETIC FIELDS; MECHANISMS; NIOBIUM; PARTICLE ACCELERATORS; POWDERS; PROFILOMETRY; SECONDARY ION MASS SPECTROMETRY; SINGLE CRYSTALS; SURFACES; TRANSITION METALS; VIBRATION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

HIGH FIELDS; RF LOSSES;

SINGLE CRYSTAL SURFACES;

EID: 51349119153     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PAC.2007.4441246     Document Type: Conference Paper

References (5)

1. Qing Ma et al., "Thermal effect on the oxides on Nb(100) studied by synchrotron-radiation x-ray photoelectron spectroscopy", J. App. Phys 96 (2004) 12.
2. H. Tian et al., Proc. of the 12th Workshop on RF Superconductivity, 2005, Cornell University, Ithaca, NY, USA.
3. K. Kowalski et al., Proc. of the 11th Workshop on RF Superconductivity, 2003, DESY, Travemunde, Germany.
4. J.Knobloch et al., "High field Q slope in superconducting cavities due to magnetic field enhancement at grain boundaries", Proc. of the 9th Workshop on RF Superconductivity, 1999, Santa Fe, USA, pp.77-91.
5. V. S. Chathapuram et al., "Role of oxidizer in the chemical mechanical planarization of the Ti/TiN barrier layer", Microelectronic Engineering, Volume 65, Issue 4, May 2003, pp. 478-488.