Measurement of a flat lens focusing in a 2D photonic crystal at optical wavelength

2008 Conference on Quantum Electronics and Laser Science Conference on Lasers and Electro-Optics, CLEO/QELS

Volumn , Issue , 2008, Pages

  Fabre, N ^a   Lalouat, L ^b   Cluzel, B ^b   Melique X ^a   Lippens, D ^a   De Fornel, F ^b   Vanbesien O ^a  

^a INSTITUT D ELECTRONIQUE   (France)

^b LABORATOIRE INTERDISCIPLINAIRE CARNOT DE BOURGOGNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRO-OPTICS; LASER SCIENCE;

CRYSTAL ATOMIC STRUCTURE; ELECTRON OPTICS; LIGHT; OPTICAL MICROSCOPY; PHOTONIC CRYSTALS; POWDERS; QUANTUM ELECTRONICS; THREE DIMENSIONAL COMPUTER GRAPHICS;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 51349113039     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CLEO.2008.4551615     Document Type: Conference Paper

References (7)

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4. A. Berrier, M. Mulot, M. Swillo, M. Qiu, L. Thylén, A. Talneau, and S. Anand, "Negative Refraction at Infrared Wavelengths in a Two-Dimensional Photonic Crystal", Phys. Rev. Lett. 93, 073902 (2004).
5. N. Fabre, S. Fasquel, C. Legrand, X. Mélique, M. Muller, M. François, O. Vanbésien and D. Lippens, "Towards focusing using photonic crystal flat lens", Opto-Electronics Review 14, 225 (2006)
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