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Volumn , Issue , 2008, Pages 2005-2010
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Process development and reliability evaluation for inline Package-on-Package (PoP) assembly
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Author keywords
Mechanical and thermo mechanical reliability; PoP; Stacking
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Indexed keywords
COMPUTER NETWORKS;
ELECTROMAGNETIC WAVE EMISSION;
ELECTROMAGNETIC WAVES;
MINIATURE INSTRUMENTS;
POLLUTION;
PRINTED CIRCUIT MANUFACTURE;
PRINTED CIRCUITS;
RELIABILITY;
ELECTRONIC COMPONENTS;
MECHANICAL AND THERMO MECHANICAL RELIABILITY;
POP;
STACKING;
PRINTED CIRCUIT BOARDS;
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EID: 51349086049
PISSN: 05695503
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ECTC.2008.4550259 Document Type: Conference Paper |
Times cited : (12)
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References (6)
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