Influence of sulfide concentration on the corrosion behavior of pure copper in synthetic seawater

Journal of Nuclear Materials

Volumn 379, Issue 1-3, 2008, Pages 154-161

  Taniguchi, Naoki ^a   Kawasaki, Manabu ^b  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

^b Inspection Development Corporation   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CONCENTRATION (PROCESS); COPPER; CORROSION; CRACKING (CHEMICAL); SEAWATER; SODIUM;

PURE COPPER; STRESS CORROSION CRACKING (SCC); SYNTHETIC SEAWATERS;

STRESS CORROSION CRACKING;

EID: 51249095144     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnucmat.2008.06.010     Document Type: Article

References (17)

1. Japan Nuclear Cycle Development Institute, JNC TN1410 2000-003, 2000.
2. Pourbaix M. Atlas of Electrochemical Equilibria in Aqueous Solutions (1966), Pergamon
3. Brookins D.G. Eh-pH Diagrams for Geochemistry (1988), Springer-Verlag
4. Abd El Haleem S.M., and Abd El Aal E.E. Corrosion (NACE) 62 2 (2006) 121
5. Gennero de Chialvo M.R., and Arvia A.J. J. Appl. Electrochem. 15 (1985) 685
6. I.S. Escobar, E. Silva, C. Silva, A. Ubal, in: Proceedings of the Fourth International Conference Copper 99-Cobre99, vol. 1, 1999, p. 371.
7. Smith J., Qin Z., King F., Werme L., and Shoesmith D.W. Corrosion (NACE) 63 2 (2007) 135
8. M. Yui, H. Sasamoto, R.C. Arthur, JNC TN8400 99-030, 1999.
9. N. Taniguchi, M. Kawasaki, S. Kawakami, M. Kubota, in: Proceedings of the 2nd International Workshop on Prediction of long Term Corrosion Behaviour in Nuclear Waste Systems, 2004, p. 24.
10. N. Honma, T. Chiba, K. Tanai, JNC TN8400 99-049, 1999.
11. Torii H., and Umemura F. Zairyo-to Kankyo 52 (2003) 358
12. Benjamin L.A., Hardie D., and Parkins R.N. British Corros. J. 23 2 (1988) 89
13. F. King, L. Ahonen, C. Taxen, U. Vuorinen, L. Werme, SKB TR-01-23, 2001.
14. Crank C. The Mathematics of Diffusion (1975), Science Publications, Oxford
15. H. Sato, PNC TN8410 98-097, 1998.
16. Case B. Electrochim. Acta 18 (1973) 293
17. T. Nishimura, R. Wada, H. Nishimoto, K. Fujiwara, N. Taniguchi, A. Honda, JNC TN8400 99-077, 1999.