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Volumn , Issue , 2008, Pages 1375-1378

Sparse representations for limited data tomography

Author keywords

Limited angle tomography; Regularization; Sparse representations

Indexed keywords

DIAGNOSTIC RADIOGRAPHY; MICROSCOPIC EXAMINATION; RESTORATION; TECHNICAL PRESENTATIONS;

EID: 51049085785     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISBI.2008.4541261     Document Type: Conference Paper
Times cited : (50)

References (11)
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  • 4
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    • Arlington, VA, IEEE
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    • Liao, H.Y.1
  • 6
    • 31744440684 scopus 로고    scopus 로고
    • Robust uncertainty principles: Exact signal reconstruction from highly incomplete frequency information
    • E. Candes, J. Romberg, and T. Tao, "Robust uncertainty principles: exact signal reconstruction from highly incomplete frequency information," IEEE Trans. Inform. Theory, vol. 52, pp. 489-509, 2006.
    • (2006) IEEE Trans. Inform. Theory , vol.52 , pp. 489-509
    • Candes, E.1    Romberg, J.2    Tao, T.3
  • 7
    • 44049111982 scopus 로고
    • Nonlinear total variation based noise removal algorithms
    • L. Rudin, S. Osher, and E. Fatemi, "Nonlinear total variation based noise removal algorithms," Physica D, vol. 60, pp. 259-268, 1992.
    • (1992) Physica D , vol.60 , pp. 259-268
    • Rudin, L.1    Osher, S.2    Fatemi, E.3
  • 8
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    • The KSVD: An algorithm for designing of overcomplete dictionaries for sparse representation
    • M. Aharon, M. Elad, and A.M. Bruckstein, "The KSVD: An algorithm for designing of overcomplete dictionaries for sparse representation," IEEE Trans. Signal Process., vol. 54, pp. 4311-4322, 2006.
    • (2006) IEEE Trans. Signal Process , vol.54 , pp. 4311-4322
    • Aharon, M.1    Elad, M.2    Bruckstein, A.M.3
  • 9
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    • Image denoising via sparse and redundant representations over learned dictionaries
    • M. Elad and M. Aharon, "Image denoising via sparse and redundant representations over learned dictionaries," IEEE Trans. Image Process., vol. 15, pp. 3736-3745, 2006.
    • (2006) IEEE Trans. Image Process , vol.15 , pp. 3736-3745
    • Elad, M.1    Aharon, M.2
  • 10
  • 11
    • 0030109465 scopus 로고    scopus 로고
    • Mean and variance of implicitly defined biased estimators (such as penalized maximum likelihood): Applications to tomography
    • J.A. Fessler, "Mean and variance of implicitly defined biased estimators (such as penalized maximum likelihood): applications to tomography," IEEE Trans. Image Process., vol. 5, pp. 493-506, 1996.
    • (1996) IEEE Trans. Image Process , vol.5 , pp. 493-506
    • Fessler, J.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.