Mean and variance of implicitly defined biased estimators (Such as penalized maximum likelihood): Applications to tomography

IEEE Transactions on Image Processing

Volumn 5, Issue 3, 1996, Pages 493-506

  Fessier, Jeffrey A ^a,b  

^a IEEE

^b UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; COMPUTER SIMULATION; FUNCTIONS; IMAGE RECONSTRUCTION; IMAGING TECHNIQUES; MATHEMATICAL MODELS; PARTIAL DIFFERENTIAL EQUATIONS;

CHAIN RULE; IMPLICIT FUNCTION THEOREM; MEAN AND VARIANCE; PENALIZED MAXIMUM LIKELIHOOD; POISSON STATISTICS; TAYLOR EXPANSION; TOMOGRAPHY; UNCONSTRAINED CONTINUOUS PARAMETERS;

PARAMETER ESTIMATION;

EID: 0030109465     PISSN: 10577149     EISSN: None     Source Type: Journal    
DOI: 10.1109/83.491322     Document Type: Article

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