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Volumn 7, Issue 3, 2008, Pages 293-296

Atomistic modeling of hole transport in ultra-thin body SOI pMOSFETs

Author keywords

Crystalline orientation; HoleTransport; MOSFET; NEGF; Silicon; Simulation; Tight binding

Indexed keywords

DIFFERENTIAL EQUATIONS; GREEN'S FUNCTION; SEMICONDUCTING SILICON COMPOUNDS; SILICON; SUBSTRATES;

EID: 50949110581     PISSN: 15698025     EISSN: 15728137     Source Type: Journal    
DOI: 10.1007/s10825-007-0161-7     Document Type: Article
Times cited : (5)

References (14)
  • 9
    • 0011575377 scopus 로고
    • Fundamental properties of III-V semiconductor two-dimensional quantized structures: The basis for optical and electronic device applications
    • In: Dingle, R. (ed.) Academic Press, New York
    • Weisbuch, C.: Fundamental properties of III-V semiconductor two-dimensional quantized structures: The basis for optical and electronic device applications. In: Dingle, R. (ed.) Semiconductors Semimetals, vol. 24, p. 1. Academic Press, New York (1987)
    • (1987) Semiconductors Semimetals , vol.24 , pp. 1
    • Weisbuch, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.