X-ray diffraction characterization of the microstructure of close-packed hexagonal nanomaterials

Powder Diffraction

Volumn 23, Issue 3, 2008, Pages 213-223

  Pu, Zhao Hui ^a   Yang, Chuan Zheng ^a   Qin, Pei ^a   Lou, Yu Wan ^a   Cheng, Li Fang ^b  

^a SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY   (China)

^b SHANGHAI JIAO TONG UNIVERSITY   (China)

Author keywords

Ni(OH)2; Nanomaterials; X ray line broadening effects; ZnO

Indexed keywords

CHARGE-DISCHARGE CYCLE; CHARGE-DISCHARGE CYCLE TESTS; LEAST-SQUARES TECHNIQUES; NEGATIVE ELECTRODE MATERIAL; STACKING FAULT PROBABILITY; X-RAY DIFFRACTION LINE BROADENING; X-RAY LINE BROADENING; ZNO;

CHARACTERIZATION; CRYSTALLITE SIZE; LITHIUM COMPOUNDS; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; STACKING FAULTS; X RAY DIFFRACTION; ZINC OXIDE;

NICKEL;

EID: 50849144329     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1154/1.2955850     Document Type: Article

References (7)

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