Characterization and research of hexagonal closed packing structured ZnO nano-powders by X-ray diffraction method

Wuji Cailiao Xuebao/Journal of Inorganic Materials

Volumn 23, Issue 1, 2008, Pages 199-202

  Cheng, Guo Feng ^a   Yang, Chuan Zheng ^b   Huang, Yue Hong ^a  

^a SHANGHAI INSTITUTE OF CERAMICS   (China)

^b SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY   (China)

Author keywords

Crystallite size; Stacking fault probability; X ray diffraction (XRD); ZnO

Indexed keywords

CHARACTERIZATION; CRYSTALLITE SIZE; NANOSTRUCTURED MATERIALS; STACKING FAULTS; X RAY DIFFRACTION ANALYSIS;

HEXAGONAL CLOSED PACKING STRUCTURE (HCPS); STACKING FAULT PROBABILITY; ZINC OXIDE NANOPOWDERS;

ZINC OXIDE;

EID: 39749146496     PISSN: 1000324X     EISSN: None     Source Type: Journal    
DOI: 10.3724/SP.J.1077.2008.00199     Document Type: Article

References (3)

1. XRD Pattern Processing. Materials Data Inc., 2005, Jade 6.0
2. Langford JI. Bouitif A, et al, J. Appl. Cryst, 1993, 26 (1): 22-32.