Optical spectrum based measurement of flotation slurry contents

International Journal of Mineral Processing

Volumn 88, Issue 3-4, 2008, Pages 80-88

  Haavisto, Olli ^a   Kaartinen, Jani ^a   Hyötyniemi, Heikki ^a  

^a AALTO UNIVERSITY   (Finland)

Author keywords

Froth flotation; On line analysis; Partial least squares; Reflectance spectroscopy; X ray fluorescence

Indexed keywords

ASSAYS; ESTIMATION; FLOTATION; FLUORESCENCE; LIGHT EMISSION; LUMINESCENCE; NETWORKS (CIRCUITS); PROCESS ENGINEERING; SLURRIES; SPECTROSCOPIC ANALYSIS;

ELEMENT CONTENTS; FLOTATION CIRCUITS; FLOTATION PLANTS; FROTH FLOTATION; HIGH FREQUENCIES; IN-BETWEEN; MONITORING AND CONTROLLING; NEAR-INFRARED REFLECTANCE; ON-LINE ANALYSIS; OPTICAL SPECTRUM; OVERALL PERFORMANCE; PARTIAL LEAST SQUARES; PLANT CONTROL; REFLECTANCE SPECTROSCOPY; SPECTRAL INFORMATIONS; SPECTRAL MEASUREMENTS; X RAY FLUORESCENCE ANALYZERS; X-RAY FLUORESCENCE; X-RAY FLUORESCENCE ANALYSIS; XRF ANALYSES;

X RAY ANALYSIS;

EID: 50849121061     PISSN: 03017516     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.minpro.2008.06.007     Document Type: Article

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