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Volumn 78, Issue 5, 2008, Pages

Monte Carlo simulations of thermal fluctuations in moderately damped Josephson junctions: Multiple escape and retrapping, switching- and return-current distributions, and hysteresis

(2)  Fenton, J C a   Warburton, P A a  

a NONE

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EID: 50849106121     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.78.054526     Document Type: Article
Times cited : (43)

References (28)
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    • This period would be set by the details of an experiment-see Sec. 4.
    • This period would be set by the details of an experiment-see Sec. 4.
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    • The McCumber parameter βc ≡ Q2 is also sometimes used to characterize the damping.
    • The McCumber parameter βc ≡ Q2 is also sometimes used to characterize the damping.
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    • Note that the numerator is the total probability of there having been no switch as the current ramps from 0 to I, so that the quotient represents the average probability per unit current of there having been no switch.
    • Note that the numerator is the total probability of there having been no switch as the current ramps from 0 to I, so that the quotient represents the average probability per unit current of there having been no switch.
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    • See also the discussion in Sec. 3.
    • See also the discussion in Sec. 3.
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    • The counterintuitive nature of the accompanying decrease in the width with increasing temperature has previously been highlighted by Krasnov in Refs..
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    • Note that, even above T high, zero voltage is expected for I< IEI and so the low-bias phase-diffusion voltage remains zero.
    • Note that, even above T high, zero voltage is expected for I< IEI and so the low-bias phase-diffusion voltage remains zero.
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    • Additionally, in a theoretical paper, Chen
    • Additionally, in a theoretical paper, Chen (Ref.) showed that close to the fluctuation-free return current, the voltage departs from V=IR. However, we neglect that dependence here.
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    • The distribution was scaled by dividing by the total probability of a switch following a single escape event.
    • The distribution was scaled by dividing by the total probability of a switch following a single escape event.
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    • For an escape event involving n retraps before eventual escape in a time Δt, the average time for each escape is Δt/ (n+1), implying an equal probability of each escape event in that average time. However, the probabilities of the first n escapes were set (Ref.) to 1, with the (n+1) th escape being assigned the probability ΓΔt/ (n+1). More rigorously, the escape rate could have been expressed by integrating over all possible values of the time te for each escape, subject to the constraint te =Δt.
    • For an escape event involving n retraps before eventual escape in a time Δt, the average time for each escape is Δt/ (n+1), implying an equal probability of each escape event in that average time. However, the probabilities of the first n escapes were set (Ref.) to 1, with the (n+1) th escape being assigned the probability ΓΔt/ (n+1). More rigorously, the escape rate could have been expressed by integrating over all possible values of the time te for each escape, subject to the constraint te =Δt.
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