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Volumn 101, Issue 9, 2008, Pages

Characterization of strong light-matter coupling in semiconductor quantum-dot microcavities via photon-statistics spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; EMISSION SPECTROSCOPY; RESONANCE; SEMICONDUCTOR MATERIALS; SEMICONDUCTOR QUANTUM DOTS; STATISTICAL METHODS;

EID: 50649122490     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.101.097401     Document Type: Article
Times cited : (53)

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