An improved feature ranking method for diagnosis of systematic timing uncertainty

2008 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT

Volumn , Issue , 2008, Pages 101-104

  Bastani, Pouria ^a   Callegari, Nicholas ^a   Wang, Li C ^a   Abadir, Magdy ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b FREESCALE SEMICONDUCTOR INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INDUSTRIAL ENGINEERING; VECTORS;

FEATURE RANKING; INTERNATIONAL SYMPOSIUM; VLSI DESIGNS;

UNCERTAINTY ANALYSIS;

EID: 50649119928     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VDAT.2008.4542422     Document Type: Conference Paper

References (8)

1. P. Bastani, et al, "Analyzing the risk of timing modeling based on path delay test," Proc. ITC, 2007.
2. Li-C. Wang, P. Bastani, M. Abadir, "Design-silicon timing correlation - a data mining perspective," Proc. DAC, 2007.
3. I. Guyon, et al, " Gene Selection for Cancer Classification using Support Vector Machines," Machine Learning, Vol 46, No. 1-3, 2002, pp. 389-422.
4. Leo Breiman. Random forests. Machine Learning Jour., vol 45, pp. 5-32, 2001.
5. B. Lee, Li-C. Wang, and M. Abadir. "Issues on Test Optimization with Known Good Dies and Known Defective Dies - A Statistical Perspective," Proc. ITC, 2006.
6. Sean Wu et al. "Statistical Analysis and Optimization of Parametric Delay Test," Proc. ITC, 2007.
7. Vladamir Vapnik, "The nature of Statistical Learning Theory," 2nd editions, Springer, 1999.
8. N. Cristianini, and J. Shawe-Taylor, "An Introduction to Support Vector Machine," Cambridge University Press, 2002.