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Volumn , Issue , 2008, Pages 517-520

Quality of automatically generated test cases based on OCL expressions

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TEST PATTERN GENERATION; VERIFICATION;

EID: 50649117574     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICST.2008.40     Document Type: Conference Paper
Times cited : (24)

References (23)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.