Analysis for accurately fitting the refractive index of SiO2 thin film

Zhongguo Jiguang/Chinese Journal of Lasers

Volumn 35, Issue 5, 2008, Pages 760-763

  Wang, Yanzhi ^a,b   Zhang, Weili ^a   Fan, Zhengxiu ^a   Huang, Jianbing ^a   Jin, Yunxia ^a   Yao, Jianke ^a,b   Shao, Jianda ^a  

^a SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

Accurately fitting; Envelop method; Refractive index of SiO2; Thin films

Indexed keywords

LIGHT REFRACTION; OPTICAL COATINGS; OPTICAL CONSTANTS; OPTICAL PROPERTIES; REFRACTIVE INDEX; REFRACTOMETERS; THICK FILMS;

ACCURATELY FITTING; ENVELOP METHOD; OPTICAL-; REFRACTIVE INDEX OF SIO2; THIN FILMS;

SILICON COMPOUNDS;

EID: 50549104411     PISSN: 02587025     EISSN: None     Source Type: Journal    
DOI: 10.3788/CJL20083505.0760     Document Type: Article

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