Effects of coherence and vector properties of the light on the resolution limit in stimulated emission depletion fluorescence microscopy

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 25, Issue 6, 2008, Pages 1378-1382

  Gao, Wanrong ^a  

^a NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; ELECTROMAGNETIC WAVES; FLUORESCENCE MICROSCOPY; LIGHT; LIGHT EMISSION; LUMINESCENCE; MICROSCOPIC EXAMINATION; STIMULATED EMISSION; VECTORS;

FOCAL REGIONS; INTENSITY DISTRIBUTIONS; STIMULATED-EMISSION-DEPLETION FLUORESCENCE MICROSCOPY; VECTOR PROPERTIES;

COHERENT LIGHT;

EID: 50449110063     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.25.001378     Document Type: Article

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