-
2
-
-
0343026224
-
-
M.Scalora, M.J.Bloemer, A.S.Manka, S.D.Pethel, J.P.Dowling and C.M.Bowden // J. Appl. Phys. 83 (1998) 2377.
-
(1998)
J. Appl. Phys.
, vol.83
, pp. 2377
-
-
Scalora, M.1
Bloemer, M.J.2
Manka, A.S.3
Pethel, S.D.4
Dowling, J.P.5
Bowden, C.M.6
-
3
-
-
0342468917
-
-
J. Szczyrbowski, G. Brauer, M. Ruske, H. Schilling and A. Zmelty // Thin Solid Films 351 (1999) 254.
-
(1999)
Thin Solid Films
, vol.351
, pp. 254
-
-
Szczyrbowski, J.1
Brauer, G.2
Ruske, M.3
Schilling, H.4
Zmelty, A.5
-
4
-
-
0036602943
-
-
Jyang-Noon Lee, Seung-Hyu Lee, Kwang-Lim Yoo, Nam-Young Kim and Chang Kwon Hwangbo // Appl. Optics 41 (2002) 3061.
-
(2002)
Appl. Optics
, vol.41
, pp. 3061
-
-
Lee, J.-N.1
Lee, S.-H.2
Yoo, K.-L.3
Kim, N.-Y.4
Hwangbo, C.K.5
-
6
-
-
0037648968
-
-
M.C. Larciprete, C. Sibilia, S. Paoloni, M.Bertolotti, F.Sarto and M.Scalora // J. Appl. Phys. 93 (2003) 5013.
-
(2003)
J. Appl. Phys.
, vol.93
, pp. 5013
-
-
Larciprete, M.C.1
Sibilia, C.2
Paoloni, S.3
Bertolotti, M.4
Sarto, F.5
Scalora, M.6
-
7
-
-
5044222812
-
-
Zurich, Switzerland, February 18-20
-
th International Zurich Symposium & Technical Exhibition on EMC (Zurich, Switzerland, February 18-20 2003).
-
(2003)
th International Zurich Symposium and Technical Exhibition on EMC
-
-
D'Amore, M.1
Sarto, M.S.2
Sarto, F.3
Bertolotti, M.4
Larciprete, M.C.5
Scalora, M.6
Sibilia, C.7
-
8
-
-
0344827236
-
-
M.S.Sarto, F.Sarto, M.C.Larciprete, M.Scalora, M.D'Amore, C.Sibilia and M.Bertolotti // IEEE Trans. Electromag. Compat. 45 (2003) 586.
-
(2003)
IEEE Trans. Electromag. Compat.
, vol.45
, pp. 586
-
-
Sarto, M.S.1
Sarto., F.2
Larciprete, M.C.3
Scalora, M.4
D'Amore, M.5
Sibilia, C.6
Bertolotti, M.7
-
9
-
-
5044238536
-
-
For example TfCalc, by Spectra Software Inc
-
For example TfCalc, by Spectra Software Inc.
-
-
-
-
10
-
-
0345374141
-
-
Brugge, Belgium, Sept. 11-15
-
th Intern. Symposium on EMC, Brugge, Belgium, Sept. 11-15, 2000, Vol. 1, pp. 483.
-
(2000)
th Intern. Symposium on EMC
, vol.1
, pp. 483
-
-
Caluri, E.1
Nanni, F.2
Sarto, F.3
Sarto, M.S.4
-
11
-
-
0032661226
-
-
Proc. of The EOS/SPIE Symposium on Optical Systems Design and production, 25-28 May 1999, Berlin, Germany
-
F.Sarto, M.Alvisi, L.Caneve, L.H.AbuHassan and S.Scaglione // SPIE 3738 (1999) 66, Proc. of The EOS/SPIE Symposium on Optical Systems Design and production, 25-28 May 1999, Berlin, Germany.
-
(1999)
SPIE
, vol.3738
, pp. 66
-
-
Sarto, F.1
Alvisi, M.2
Caneve, L.3
AbuHassan, L.H.4
Scaglione, S.5
-
12
-
-
0033149030
-
-
F. Sarto, M. Alvisi, E. Melissano, A. Rizzo, S. Scaglione and L. Vasanelli // Thin Solid Films 346 (1999) 196.
-
(1999)
Thin Solid Films
, vol.346
, pp. 196
-
-
Sarto, F.1
Alvisi, M.2
Melissano, E.3
Rizzo, A.4
Scaglione, S.5
Vasanelli, L.6
-
15
-
-
5044222813
-
-
September 08-12, Torino, Italy
-
M.S.Sarto, F.Sarto, M.C.Larciprete, M.D'Amore, C.Sibilia, M.Bertolotti and M.Scalora // Proc. of International Conference on Electromagnetics in Advanced Applications (ICEAA03) September 08-12, 2003, Torino, Italy.
-
(2003)
Proc. of International Conference on Electromagnetics in Advanced Applications (ICEAA03)
-
-
Sarto, M.S.1
Sarto, F.2
Larciprete, M.C.3
D'Amore, M.4
Sibilia, C.5
Bertolotti, M.6
Scalora, M.7
-
17
-
-
0032482832
-
-
M. Bender, W..Seelig, C. Daube, H. Frankenberger, B. Ocker and J. Stollenwerk // Thin Solid Films 326 (1998) 67.
-
(1998)
Thin Solid Films
, vol.326
, pp. 67
-
-
Bender, M.1
Seelig, W.2
Daube, C.3
Frankenberger, H.4
Ocker, B.5
Stollenwerk, J.6
-
20
-
-
5044224852
-
-
From calculation of the SE performed by using the transfer matrix method, as described in details in ref. [8]
-
From calculation of the SE performed by using the transfer matrix method, as described in details in ref. [8].
-
-
-
-
22
-
-
5044237813
-
-
The International Standard ISO/CIE 10527; CIE Draft Standard DS 010.2/E-2001 Photometry - The CIE System of Physical Photometry; the Commission Internationale del'Eclarirage (CIE)
-
ISO/CIE 10527:Colorimetric Observers, The International Standard ISO/CIE 10527; CIE Draft Standard DS 010.2/E-2001 Photometry - The CIE System of Physical Photometry; the Commission Internationale del'Eclarirage (CIE).
-
ISO/CIE 10527: Colorimetric Observers
-
-
|