High tilt, automated, electron tomography of materials by incoherent (HAADF) and inelastic (EFTEM) scattering

Institute of Physics Conference Series

Volumn 179, Issue , 2004, Pages 349-352

  Weyland, M ^a   Laffont, L ^a   Midgley, P A ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TOMOGRAPHY; ENERGY FILTERED TRANSMISSION ELECTRON MICROSCOPY (EFTEM); HIGH ANGULAR ANNULAR DARK FIELDS (HAADF); SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM);

CHEMICAL ANALYSIS; COMPUTATIONAL GEOMETRY; ENERGY DISSIPATION; GRAIN BOUNDARIES; IONIZATION; STAINLESS STEEL; THIN FILMS; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRONS;

EID: 5044221692     PISSN: 09513248     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. Midgley P A et al. 2001 Chemical Communications 907-908
2. Weyland M and Midgley P 2003 Microscopy &Microanalysis In press
3. Mobus G and Inkson B J 2001 Applied Physics Letters 79 1369-1371
4. Van Aert S et al. 2002 Journal of Structural Biology 138 21-33
5. Dierksen K et al. 1992 Ultramicroscopy 40 71-87
6. [61 Ziese U et al. 2002 Journal of Microscopy 205 187-200