Modern approaches to the preparation of TEM samples

Institute of Physics Conference Series

Volumn 179, Issue , 2004, Pages 357-362

  Newcomb, S B ^a  

^a NEWPORT CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POTENTIAL; ELECTROSTATIC LENSES; ETCHING; ION BEAMS; IONS; MICROSTRUCTURE; ORGANOMETALLICS; SAMPLING; SUBSTRATES; THIN FILMS;

BEAM CURRENTS; BROAD BEAM MILLING; ION BEAM THINNING; ORGANO-METALLIC PRECURSOR GASES;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 5044219853     PISSN: 09513248     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (20)

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2. Goodhew P J 1985 Thin Foil Preparation for Electron Microscopy (New York: Elsevier)
3. Newcomb S B Boothroyd CB and Stobbs W M 1985 J. Microsc. 140 195-207
4. Young R J 1993 Vacuum 44 353-361
5. Bischoff L and Teichert J 1997 Materials Science Forum 248 445-454
6. Prewett P D 1993 Vacuum 44 345-352
7. Park K H 1990 Mater. Res. Symp. Proc. 199 271-280
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11. th EUREM, Czech Republic IP567
12. Dunin-Borkowski D B Newcomb S B Doyle D Deignan A and McCarmey M R Ibid 164
13. Kamino T 2001 Workshop on Advances in Focused Ion Beam Microscopy: FIB 2001, Oxford
14. Newcomb S B Warr B D and Stobbs WM 1994 ICEM 13, France p1103
15. th EUREM, Czech Republic P575
16. th MCEM, Lecce p429
17. Murphy M Laugier M T Beake B D Sutton D and Newcomb S B 2002 J. Mat. Sci. 372053-2062
18. th EUREM, Czech Republic P573
19. Lozano-Perez S Huang Y Langford R and Titchmarsh J M 2001 Inst. Phys. Conf. Ser. 168 (Bristol: IOP)p191
20. Sutton D Parle S M and Newcomb S B 2001 Ibid p 377