Local/global fault diagnosis of event-driven systems based on Bayesian network and timed Markov mode

Proceedings of the SICE Annual Conference

Volumn , Issue , 2007, Pages 540-545

  Inagaki, Shinkichi ^a   Suzuki, Tatsuya ^a   Saito, Mitsuo ^a   Aoki, Takeshi ^b  

^a NAGOYA UNIVERSITY   (Japan)

^b NAGOYA MUNICIPAL INDUSTRIAL RESEARCH INSTITUTE   (Japan)

Author keywords

Bayesian network; Decentralized fault diagnosis; Event driven system; Timed markov model

Indexed keywords

DATA HANDLING; DISTRIBUTED PARAMETER NETWORKS; ELECTRIC FAULT CURRENTS; INFERENCE ENGINES; INTELLIGENT NETWORKS; MARKOV PROCESSES; SPEECH ANALYSIS;

ANNUAL CONFERENCE; BAYESIAN; BAYESIAN NETWORK; BAYESIAN NETWORK (BN); CAUSAL RELATIONSHIPS; COMPUTATIONAL BURDEN; CONDITIONAL PROBABILITIES; CONTROL ENGINEERS; CONTROLLED PLANT; CONTROLLED SYSTEMS; DECENTRALIZED FAULT DIAGNOSIS; DIAGNOSER; EVENT-DRIVEN SYSTEM; EVENT-DRIVEN SYSTEMS; FAULT DIAGNOSIS; LOCAL DIAGNOSIS; MARKOV MODELLING; PROGRAMMABLE LOGIC CONTROLLER (PLC); TIMED MARKOV MODEL; TRANSFER LINES;

BAYESIAN NETWORKS;

EID: 50249152271     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SICE.2007.4421042     Document Type: Conference Paper

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