Defect-induced negative differential resistance in single-walled carbon nanotubes

Applied Physics Letters

Volumn 93, Issue 7, 2008, Pages

  Buchs, G ^a   Ruffieux, P ^a   Groning P ^a   Groning O ^a  

^a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SPECTROSCOPY; DEFECTS; EXCAVATION; HYDROGEN; IMAGING TECHNIQUES; MICROSCOPIC EXAMINATION; NANOCOMPOSITES; NANOPORES; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOTECHNOLOGY; NANOTUBES; NEGATIVE RESISTANCE; NITROGEN; NONMETALS; SCANNING TUNNELING MICROSCOPY; SINGLE-WALLED CARBON NANOTUBES (SWCN); TUNNELING (EXCAVATION);

) ELECTRONIC STATE; ATOMIC DEFECTS; BAND GAPS; DEFECT SITES; NEGATIVE DIFFERENTIAL RESISTANCES; NEGATIVE-DIFFERENTIAL-RESISTANCE; NITROGEN PLASMAS; POSITIVE BIAS; SINGLE-WALLED CARBON NANOTUBES; SPECTRAL SHAPING; TUNNELING BARRIERS; TUNNELING SPECTRA;

CARBON NANOTUBES;

EID: 50249086276     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2975177     Document Type: Article

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