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Volumn , Issue , 2007, Pages 2597-2600

A silicon carbide capacitive pressure sensor for high temperature and harsh environment applications

Author keywords

Capacitive; Harsh environment; Pressure sensor; Silicon carbide

Indexed keywords

ACTUATORS; CAPACITANCE; ELECTRIC POWER SYSTEMS; HIGH TEMPERATURE APPLICATIONS; MICROSYSTEMS; NONMETALS; PARTIAL PRESSURE SENSORS; PRESSURE SENSORS; PRESSURE TRANSDUCERS; SILICON; SILICON CARBIDE; TRANSDUCERS;

EID: 50149113165     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SENSOR.2007.4300703     Document Type: Conference Paper
Times cited : (41)

References (4)
  • 1
    • 0030646872 scopus 로고    scopus 로고
    • Operation of a 6H-SiC Pressure Sensor
    • at, 97, Chicago, IL, pp
    • R. Okojie, A. Ned, and A. Kurtz, "Operation of a 6H-SiC Pressure Sensor at 500°C," Technical Digest, Transducers'97, Chicago, IL, pp. 1407-1409, 1997.
    • (1997) Technical Digest, Transducers
    • Okojie, R.1    Ned, A.2    Kurtz, A.3
  • 3
    • 3242691456 scopus 로고    scopus 로고
    • High-Temperature Single-Crystal 3C-SiC Capacitive Pressure Sensor
    • D. Young, J. Du, C. Zorman, and W. Ko, "High-Temperature Single-Crystal 3C-SiC Capacitive Pressure Sensor," IEEE Sensors J., Vol. 4, No. 4, pp. 464-470, 2004.
    • (2004) IEEE Sensors J , vol.4 , Issue.4 , pp. 464-470
    • Young, D.1    Du, J.2    Zorman, C.3    Ko, W.4
  • 4
    • 26944464232 scopus 로고    scopus 로고
    • Low-stress Heavily-Doped Polycrystalline Silicon Carbide for MEMS Applications
    • Orlando, FL, pp
    • J. Trevino, X. Fu, C. Zorman, and M. Mehregany, "Low-stress Heavily-Doped Polycrystalline Silicon Carbide for MEMS Applications," Proc. of IEEE MEMS Conference, Orlando, FL, pp. 451-454, 2005.
    • (2005) Proc. of IEEE MEMS Conference , pp. 451-454
    • Trevino, J.1    Fu, X.2    Zorman, C.3    Mehregany, M.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.