Phase-space evolution of x-ray coherence in phase-sensitive imaging

Applied Optics

Volumn 47, Issue 22, 2008, Pages

  Wu, Xizeng ^a   Liu, Hong ^b  

^a University of Alabama at Birmingham   (United States)

^b University of Oklahoma   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETRY; SPECTRAL DENSITY;

COHERENCE CONDITIONS; CROSS SPECTRAL DENSITIES; INCOHERENT SOURCES; INTERFEROMETRIC IMAGING; PHASE SENSITIVE IMAGING; PHASE SPACE FORMULATION; WIGNER DISTRIBUTION; X-RAY DARK FIELD IMAGING;

PHASE SPACE METHODS;

ALGORITHM; ARTICLE; COMPUTER ASSISTED DIAGNOSIS; IMAGE QUALITY; INTERFEROMETRY; METHODOLOGY; OPTICAL COHERENCE TOMOGRAPHY; PHASE CONTRAST MICROSCOPY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; X RAY DIFFRACTION;

ALGORITHMS; INTERFEROMETRY; MICROSCOPY, PHASE-CONTRAST; RADIOGRAPHIC IMAGE ENHANCEMENT; RADIOGRAPHIC IMAGE INTERPRETATION, COMPUTER-ASSISTED; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; TOMOGRAPHY, OPTICAL COHERENCE; X-RAY DIFFRACTION;

EID: 50049129423     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.47.000E44     Document Type: Article

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