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Volumn , Issue , 2007, Pages 545-548
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Moving-mask UV lithography for 3-dimensional positive- and negative-tone thick photoresist microstructuring
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Author keywords
3 dimensional microfabrication; Simulation; Thick photoresist; UV lithography
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Indexed keywords
ACTUATORS;
DISSOLUTION;
LITHOGRAPHY;
MICROSYSTEMS;
NANOFLUIDICS;
PHOTORESISTORS;
SENSORS;
SURFACE TREATMENT;
THREE DIMENSIONAL;
TRANSDUCERS;
TURBULENT FLOW;
3-DIMENSIONAL;
3-DIMENSIONAL MICROFABRICATION;
DEVELOPMENT PROCESSES;
FAST MARCHING METHOD;
INTERNATIONAL CONFERENCES;
MICROFLUIDIC STRUCTURES;
MICROSTRUCTURING;
NEGATIVE TONES;
NOVEL METHODS;
SIMULATION;
SIMULATION APPROACH;
SOLID-STATE SENSORS;
SYSTEMATIC STUDY;
THICK PHOTORESIST;
THICK PHOTORESISTS;
UV LITHOGRAPHY;
PHOTORESISTS;
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EID: 50049095041
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/SENSOR.2007.4300188 Document Type: Conference Paper |
Times cited : (6)
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References (7)
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