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Volumn 14, Issue 9-11, 2008, Pages 1607-1612
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Investigations of SU-8 removal from metallic high aspect ratio microstructures with a novel plasma technique
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Author keywords
[No Author keywords available]
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Indexed keywords
ASPECT RATIO;
CARBON;
CHEMICAL REACTIONS;
ELECTRONICS INDUSTRY;
ETCHING;
EXPERIMENTS;
FREE RADICAL POLYMERIZATION;
GRAPHITE;
ION BOMBARDMENT;
MASKS;
METAL RECOVERY;
METALS;
MICROWAVES;
MOLECULAR BEAM EPITAXY;
NONMETALS;
OXYGEN;
PHOTORESISTS;
PLASMA DIAGNOSTICS;
PLASMA ETCHING;
PLASMAS;
RATE CONSTANTS;
RELIABILITY;
STRUCTURAL METALS;
THICK FILMS;
WEIGHT CONTROL;
APPLICATION EXAMPLES;
BASIC IDEA;
CHEMICAL RADICALS;
CHEMICAL-;
CONTROLLED PROCESS;
ETCHING PROCESSES;
ETCHING RATES;
HIGH ASPECT RATIO MICROSTRUCTURES;
METAL STRUCTURES;
MICRO-PARTS;
MICROWAVE PLASMA;
OXYGEN RADICALS;
PLASMA ETCHING TECHNIQUE;
PLASMA TECHNIQUES;
PLASMA ZONE;
SENSITIVE MATERIALS;
SU-8 REMOVAL;
THERMAL MANAGEMENT;
TRAVELING WAVES;
WATER COOLING;
X-RAY MASKS;
X RAY LITHOGRAPHY;
ETCHING;
GRAPHITE;
MASKING;
MICROSTRUCTURE;
PLASMA;
SUBSTRATES;
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EID: 49949117624
PISSN: 09467076
EISSN: None
Source Type: Journal
DOI: 10.1007/s00542-007-0537-4 Document Type: Conference Paper |
Times cited : (17)
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References (7)
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