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Volumn 14, Issue 9-11, 2008, Pages 1607-1612

Investigations of SU-8 removal from metallic high aspect ratio microstructures with a novel plasma technique

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; CARBON; CHEMICAL REACTIONS; ELECTRONICS INDUSTRY; ETCHING; EXPERIMENTS; FREE RADICAL POLYMERIZATION; GRAPHITE; ION BOMBARDMENT; MASKS; METAL RECOVERY; METALS; MICROWAVES; MOLECULAR BEAM EPITAXY; NONMETALS; OXYGEN; PHOTORESISTS; PLASMA DIAGNOSTICS; PLASMA ETCHING; PLASMAS; RATE CONSTANTS; RELIABILITY; STRUCTURAL METALS; THICK FILMS; WEIGHT CONTROL;

EID: 49949117624     PISSN: 09467076     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00542-007-0537-4     Document Type: Conference Paper
Times cited : (17)

References (7)
  • 1
    • 0036643859 scopus 로고    scopus 로고
    • Removal of SU-8 photoresist for thick film applications. In: Proceedings of 27th conference on micro- and nano-engineering MNE 2001
    • Dentinger PM, Clift WM, Goods SH (2002) Removal of SU-8 photoresist for thick film applications. In: Proceedings of 27th conference on micro- and nano-engineering MNE 2001. Microelectron Eng 61-62:993-1000
    • (2002) Microelectron Eng , vol.6162 , pp. 993-1000
    • Dentinger, P.M.1    Clift, W.M.2    Goods, S.H.3
  • 6
    • 4644340449 scopus 로고    scopus 로고
    • SU 8 resist plasma etching and its optimisation
    • Hong G, Holmes AS, Heaton MA (2004) SU 8 resist plasma etching and its optimisation. Microsyst Technol 10:357-359
    • (2004) Microsyst Technol , vol.10 , pp. 357-359
    • Hong, G.1    Holmes, A.S.2    Heaton, M.A.3
  • 7
    • 49949099395 scopus 로고    scopus 로고
    • PVA TePla Press release, December 2006
    • PVA TePla Press release, December 2006 (2006)
    • (2006)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.