Verifying the RTE model: Ortho-positronium lifetime measurement on controlled pore glasses

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 4, Issue 10, 2007, Pages 3819-3822

  Thraenert, S ^a   Hassan, E M ^a   Enke, D ^a   Fuerst, D ^a   Krause Rehberg, R ^a  

^a MARTIN LUTHER UNIVERSITY HALLE WITTENBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CONTROLLED PORE GLASSES; DIFFERENT PORE SIZES; HOST MATERIALS; INTERNATIONAL CONFERENCES; LIFETIME MEASUREMENTS; LOW TEMPERATURES; POROUS MEDIUMS; TEMPERATURE DEPENDENCES;

GLASS; PORE SIZE; POROSITY; POROUS MATERIALS; POSITRON ANNIHILATION; POSITRON ANNIHILATION SPECTROSCOPY; RADIATION DAMAGE; SUPERCONDUCTING MATERIALS; TEMPERATURE DISTRIBUTION;

POSITRONS;

EID: 49949112957     PISSN: 18626351     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssc.200675738     Document Type: Conference Paper

References (8)

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