Dependence of surface morphology on molecular structure and its influence on the properties of OLEDs

Ultramicroscopy

Volumn 108, Issue 10, 2008, Pages 1251-1255

  Lim, S H ^a   Ryu, G Y ^a   Seo, J H ^a   Park, J H ^a   Youn, S W ^a   Kim, Y K ^a   Shin, D M ^a  

^a Hong Ik University   (South Korea)

Author keywords

ABCV P; ABCV Th; Atomic force microscopy; Red OLED; Surface morphology

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROLUMINESCENCE; ELECTRON INJECTION; FLUORESCENCE; GEOPHYSICAL PROSPECTING; LIGHT; LIGHT EMISSION; LIGHT EMITTING DIODES; LUMINESCENCE; METRIC SYSTEM; MICROSCOPIC EXAMINATION; MOLECULAR BEAM EPITAXY; MOLECULAR STRUCTURE; MULTILAYERS; OPTICAL DESIGN; ORGANIC LIGHT EMITTING DIODES (OLED); PHOTORESISTS; QUANTUM CHEMISTRY; SCANNING PROBE MICROSCOPY; SURFACE MORPHOLOGY; SURFACE STRUCTURE; SURFACES; VACUUM DEPOSITION;

ABCV-P; ABCV-TH; DEVICE PERFORMANCES; DICYANOMETHYLENE; ELECTROLUMINESCENCE PROPERTIES; ELECTRON INJECTION LAYER; ELECTRON-TRANSPORT LAYER; EMISSION LAYERS; HOLE INJECTION LAYER; HOLE-TRANSPORT LAYER; MULTI-LAYER STRUCTURES; ORGANIC LAYERS; ORGANIC LIGHT-EMITTING DIODES; ORGANIC MATERIALS; RED-OLED; SOLID FILMS; TERPHENYL; THIENYL; THIN SOLID FILMS; VACUUM THERMAL DEPOSITION;

IMAGING TECHNIQUES;

3,3 [4,4'' BIS(DIMETHYLAMINO) 1,1' 4',1'' TERPHENYL 2',5'DIYL]BIS 2 PHENYLACRYLONITRILE; 3,3 [4,4'' BIS(DIMETHYLAMINO) 1,1' 4',1'' TERPHENYL 2',5'DIYL]BIS[2(2 THIENYL)ACETONITRILE; 4 (DICYANOMETHYLENE) 2 METHYL 6 (JULOLIDIN 4 YL VINYL) 4H PYRAN; INDIUM TIN OXIDE; OXIDE; UNCLASSIFIED DRUG;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL STRUCTURE; FILM; FLUORESCENCE; LIGHT EMITTING DIODE; LUMINESCENCE; SYNTHESIS;

EID: 49949112744     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.04.093     Document Type: Article

References (13)

1. Tang C.W., and VanSlyke S.A. Appl. Phys. Lett. 51 (1987) 913
2. Tang C.W., VanSlyke S.A., and Chen C.H. Appl. Phys. 65 (1989) 3610
3. Chen C.-T. Chem. Mater. 16 (2004) 4389
4. Kim D.U., Paik S.H., Kim S.-H., and Tsutsui T. Synth. Meter. 123 (2001) 43
5. Yeh H.-C., Yeh S.-J., and Chen C.-T. Chem. Commun. (2003) 2632
6. Thomas K.R.J., Lin J.T., Velusamy M., Tao Y.-T., and Chuen C.-H. Adv. Funct. Mater. 14 (2004) 83
7. Yu J., Chen Z., Sone M., Miyata S., Li M., and Watababe T. Jpn. J. Appl. Phys. 40 (2001) 3201
8. Liu Z., Chen Z.-J., and Gong Q.-H. Chin. Phys. Lett. 22 (2005) 1536
9. Wu W.-C., Yeh H.-C., Chan L.-H., and Chen C.-T. Adv. Mater. 14 (2002) 1072
10. Thomas K.R.J., Lin J.T., Tao Y.-T., and Chuen C.-H. Adv. Mater. 14 (2002) 822
11. Hung L.S., and Chen C.H. Mater. Sci. Eng. R 39 (2002) 143
12. Youn S.W., Ryu G.Y., and Shin D.M. J. Nonlinear Opt. Phys. Mater. 13 (2004) 601
13. We gave blue-shifted λmax of solid-state PL and EL spectra in our earlier reports, which were 'the 11th international Symposium on Advanced Display Materials and Devices' for ABCV-Th and 'Journal of Physics and Chemistry of Solids., 69, 1314, (2008)' for ABCV-P, as much as about 20 nm because measurement of PL using the Perkin-Elmer LS50B fluorimeter recorded the blue-shifted spectra in red region. Therefore, the correction was carried out using Perkin-Elmer LS55 fluorimeter and the corrected PL and EL wavelengths were reported here.