Electron beam lithography-assisted fabrication of Au nano-dot array as a substrate of a correlated AFM and confocal Raman spectroscopy

Ultramicroscopy

Volumn 108, Issue 10, 2008, Pages 1302-1306

  Lee, Seung Woo ^a   Shin, Yong Beom ^b   Jeon, Ki Seok ^c   Jin, Seung Min ^c   Suh, Yung Doug ^c   Kim, Sanghyo ^d   Lee, Jae Jong ^a   Kim, Min Gon ^b  

^a Korea Institute of Machine and Materials   (South Korea)

^b Korea Research Institute of Bioscience and Biotechnology (KRIBB)   (South Korea)

^c Korea Research Institute of Chemical Technology   (South Korea)

^d Gachon University   (South Korea)

Author keywords

Atomic force microscopy; Confocal Raman; Electron beam; Nanoparticle; Surface enhanced Raman scattering

Indexed keywords

ARCHITECTURAL ACOUSTICS; ELECTRON BEAMS; ELECTRON GUNS; ELECTRON OPTICS; ELECTRONICS INDUSTRY; MICROELECTRONICS; OPTICAL DESIGN; PARTICLE BEAMS;

ATOMIC FORCE MICROSCOPY; CONFOCAL RAMAN; CONFOCAL RAMAN SPECTROSCOPY; ELECTRON BEAM; GLASS WAFERS; NANO DOTS; NANOPARTICLE; PAPER DOCUMENTS; SURFACE-ENHANCED RAMAN SCATTERING;

ELECTRON BEAM LITHOGRAPHY;

(N (6 (BIOTINAMIDO)HEXYL) 3' (2' PYRIDYLDITHIO) PROPIONAMIDE; ALCOHOL; BIOTIN; CHROMIUM; GOLD; POLY(METHYL METHACRYLATE); PROPIONAMIDE DERIVATIVE; QUANTUM DOT; TITANIUM; UNCLASSIFIED DRUG;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL STRUCTURE; ELECTRON BEAM; MICROARRAY ANALYSIS; PARTICLE SIZE; RAMAN SPECTROMETRY; SCANNING ELECTRON MICROSCOPY; ULTRASOUND;

DESIGN; ELECTRON BEAMS; LITHOGRAPHY; MICROSCOPY; OPTICAL INSTRUMENTS; RAMAN SPECTROSCOPY; SCATTERING;

EID: 49949106799     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.04.056     Document Type: Article

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