Probe three-dimensional structure of soft organized surfactants at solid-liquid interface with an AFM in MAC Mode and contact mode

Ultramicroscopy

Volumn 108, Issue 10, 2008, Pages 1009-1012

  Han, Wenhai ^a  

^a AGILENT TECHNOLOGIES   (United States)

Author keywords

Atomic force microscopy; DTAB; MAC Mode; Surfactant

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; COLLOIDS; CONCENTRATION (PROCESS); CRITICAL MICELLE CONCENTRATION; EXTREME ULTRAVIOLET LITHOGRAPHY; IMAGING TECHNIQUES; IONIZATION OF LIQUIDS; LIGHT MEASUREMENT; MICA; MICELLES; MICROSCOPIC EXAMINATION; SCANNING PROBE MICROSCOPY; SILICATE MINERALS; SOLUTIONS; SURFACE ACTIVE AGENTS; THREE DIMENSIONAL;

AQUEOUS SOLUTIONS; ATOMIC FORCE MICROSCOPE; CONTACT MODES; CRITICAL MICELLE CONCENTRATION (CMC); DOUBLE LAYERS; DTAB; ELECTROSTATIC INTERACTIONS; HYDROPHILIC SURFACES; IONIC SURFACTANTS; MAC MODE; REDUCED HEIGHT; SOLID SURFACES; SOLID-LIQUID INTERFACES; SURFACTANT; THREE-DIMENSIONAL STRUCTURING; VISUALIZATION TOOLS;

PHASE INTERFACES;

IONIC SURFACTANT;

ADSORPTION; AQUEOUS SOLUTION; ARTICLE; ATOMIC FORCE MICROSCOPY; CRITICAL MICELLE CONCENTRATION; ELECTRICITY; HYDROPHILICITY; THREE DIMENSIONAL IMAGING; TOPOGRAPHY;

EID: 49949095546     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.04.087     Document Type: Article

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