Completeness in SMT-based BMC for software programs

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2008, Pages 831-836

  Ganai, Malay K ^a   Gupta, Aarti ^a  

^a NEC LABORATORIES AMERICA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDED MODEL CHECKING; EFFICIENT METHODS; FREE PATHS; SOFTWARE PROGRAMS;

COMPUTER SOFTWARE; ELECTRIC INSTRUMENT TRANSFORMERS; INDUSTRIAL ENGINEERING; MODEL CHECKING; TESTING;

STRUCTURED PROGRAMMING;

EID: 49749117430     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2008.4484777     Document Type: Conference Paper

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