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Volumn , Issue , 2007, Pages 111-114

Performance enhancement of the tunnel field effect transistor using a SiGe source

Author keywords

Band to band tunneling; Device simulation; Gated p i n diode; Sub threshold swing; Tunnel field effect transistor (TFET)

Indexed keywords

ELECTRIC CONDUCTIVITY; FIELD EFFECT TRANSISTORS; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR MATERIALS; SEMICONDUCTOR SWITCHES;

EID: 49749107881     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IWPSD.2007.4472465     Document Type: Conference Paper
Times cited : (7)

References (7)
  • 3
    • 50549156338 scopus 로고    scopus 로고
    • E.O. Kane, Zener Tunneling in Semiconductors, J. of Phy. Chem. & Solids, 12, no.2, p.p. 181-188, 1960
    • E.O. Kane, "Zener Tunneling in Semiconductors", J. of Phy. Chem. & Solids, vol. 12, no.2, p.p. 181-188, 1960
  • 4
    • 49749132751 scopus 로고    scopus 로고
    • Medici user guide. Version Y.2006-06
    • Medici user guide. Version Y.2006-06
  • 5
    • 49749125893 scopus 로고    scopus 로고
    • US Patent no. 6621131 Sept. 2003
    • US Patent no. 6621131 Sept. 2003
  • 6
    • 0036923304 scopus 로고    scopus 로고
    • I-MOS: A novel semiconductor device with a subthreshold slope lower than kT/q
    • K. Gopalakrishnan, P. Griffin. J. Plummer, "I-MOS: a novel semiconductor device with a subthreshold slope lower than kT/q", IEDM Tech Digest 2002, pp 289-292
    • (2002) IEDM Tech Digest , pp. 289-292
    • Gopalakrishnan, K.1    Griffin, P.2    Plummer, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.