Experimental technique to correlate optical excitation intensities with electrical excitation intensities for semiconductor optoelectronic device characterization

Semiconductor Science and Technology

Volumn 23, Issue 8, 2008, Pages 085018-

  Masui, Hisashi ^a   Nakamura, Shuji ^a   Denbaars, Steven P ^a  

^a University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DC-DC CONVERTERS; ELECTROOPTICAL DEVICES; LIGHT; LIGHT EMISSION; LIGHT EMITTING DIODES; LUMINESCENCE; OPTOELECTRONIC DEVICES; SEMICONDUCTOR QUANTUM WELLS;

ELECTRICAL EXCITATIONS; ELECTROLUMINESCENCE MEASUREMENTS; EXPERIMENTAL TECHNIQUES; FORWARD CURRENTS; GREEN LIGHT; OPTICAL EXCITATIONS; OPTOELECTRONIC DEVICE CHARACTERIZATION; PHOTO-LUMINESCENCE MEASUREMENTS; REVERSE-SATURATION CURRENTS;

PHOTOEXCITATION;

EID: 49749099333     PISSN: 02681242     EISSN: 13616641     Source Type: Journal    
DOI: 10.1088/0268-1242/23/8/085018     Document Type: Article

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