Thermal degradation behavior of aluminum-doped zinc-oxide thin films prepared by using a sol-gel process

Journal of the Korean Physical Society

Volumn 53, Issue 1, 2008, Pages 188-191

  Lee, Seoung Soo ^a   Kim, Yong Nam ^a   Shin, Hyun Gyoo ^a   Song, Jun Kwang ^a   Lee, Hee Soo ^b  

^a Korea Testing Laboratory   (South Korea)

^b Pusan National University   (South Korea)

Author keywords

Aluminum doped zinc oxide; Sol gel; Thermal degradation; Thin film

Indexed keywords

EID: 49649112193     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: 10.3938/jkps.53.188     Document Type: Conference Paper

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