A 2.7V 9.8Gb/s burst-mode TIA with fast automatic gain locking and coarse threshold extraction

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn 51, Issue , 2008, Pages 220-221

  De Ridder, Tine ^a   Ossieur, Peter ^b   Baekelandt, Bart ^c   Mélange, Cedric ^c   Bauwelinck, Johan ^a   Ford, Colin ^d   Qiu, Xing Zhi ^a   Vandewege, Jan ^a  

^a GHENT UNIVERSITY   (Belgium)

^b RESEARCH FOUNDATION FLANDERS FWO   (Belgium)

^c IWT Vlaanderen   (Belgium)

^d Centre for Integrated Photonics   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

NETWORKS (CIRCUITS); SOLID STATE DEVICES;

BI-CMOS PROCESS; BURST-MODE TIA; LOCKING MECHANISM;

LOCKS (FASTENERS);

EID: 49549107791     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISSCC.2008.4523136     Document Type: Conference Paper

References (6)

1. S. Nishihara, Sh. Kimura, T. Yoshida, et al., "A 10.3125-Gbit/s SiGe BiCMOS Burst-Mode 3R Receiver for 10G-EPON Systems," Optical Fiber Communication Conf. Proc., PDP8, Mar. 2007.
2. M. Nakamura, Y. Imai, Y. Umeda, et al., "1.25Gb/s Burst-Mode Receiver ICs with quick response for PON Systems," ISSCC Dig. Tech. Papers, pp. 226-227, Feb. 2005.
3. Q. Le, S. G. Lee, H. Y. Kang, et. al., "A CMOS Burst-Mode TIA with Step AGC and Selective Internally Created Reset for 1.2SGb/s EPON," ISSCC Dig. Tech. Papers, pp. 50-51, Feb. 2007.
4. P. Ossieur, T. De Ridder, J. Bauwelink, et al., Systems and Methods for Transferring Single-Ended Burst Signal on to Differential Lines, Especially for Use in Burst-Mode Receiver," International Patent Application, PCT/EP2006/067215, 9 Oct. 2006.
5. P. Ossieur, D.Verhulst, Y Martens, et al., "A 1.25-Gb/s Burst-Mode Receiver for GPON Applications," IEEE J. Solid-State Circuits, vol. 40, no. 5, pp. 1180-1189, May 2005.
6. A. Neugroschel, C-T. Sah, M.S. Carroll, "Degradation of Bipolar Transistor Current Gain by Hot Holes During Reverse Emitter-Base Bias Stress," IEEE Trans. Electron Devices, vol. 43, no. 8, pp. 1286-1290, Aug. 1996.